STI Electronics' Mel Parrish to Chair the 7-30 Product Assurance Committee Meeting at IPC APEX 2011

STI Electronics, Inc., a full service organization providing training, electronic and industrial distribution, consulting, laboratory analysis, prototyping, and small- to medium-volume PCB assembly, announces that Mel Parrish, FSO/Director of Training Materials, will chair the 7-30 Product Assurance Committee meeting at the upcoming IPC APEX EXPO, scheduled to take place April 12-14, 2011 at the Mandalay Bay Resort & Convention Center in Las Vegas. The meeting will be held during the Management Session of the Standards Development Meetings, which will take place Monday, April 11, 2011 at 8 a.m.
 
This is a planning meeting for all task group and subcom­mittee leaders of the Product Assurance Standards Committees. It allows the group leaders to discuss common issues, request and provide coordination or assistance for these essential IPC documents.
 
Mel chairs the IPC Product Assurance General Committee, responsible for the oversight of documents such as IPC-A-600, IPC-A-620 and IPC-A-610. Parrish has been a member of the TAEC and Committee Chairman Council (CCC) for more than ten years, and is past recipient of the IPC President’s Award in recognition of his leadership and technical contributions.
 
After retiring from his work as an electronics curriculum designer for the Air Force, Parrish continued to work with standards development and training as President of Manufacturing Technology Training Center (MTTC) and worked with the Navy at China Lake during the generation of WS-6536 through MIL-STD-2000. In addition to his IPC Master Instructor status for IPC-A-610, IPC-A-620, J-STD-001, Parrish has previous DoD certifications for WS-6536, DOD-STD-2000 and MIL-STD-2000.
 
Complementing his expertise in electronics manufacturing, Parrish has more than 30 years of experience in workforce development, skills standards, curriculum design and development, and management for electronic technology and production disciplines.